TY  - JOUR
AU  - Teague, L
AU  - Jurchescu, Oana
AU  - Richter, Curt
AU  - Subramanian, Sanker
AU  - Anthony, John
AU  - Jackson, Thomas
AU  - Gundlach, David
AU  - Kushmerick, James
C2  - Applied Physics Letters
DA  - 2010-05-01 00:05:00
LA  - en
M1  - 96
PB  - Applied Physics Letters
PY  - 2010
TI  - Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907043
ER  -