TY  - GEN
AU  - Kim, Seungkwan
AU  - Hong, Keesuk
AU  - Lee, Dong-Hoon
AU  - Livigni, David
AU  - Li, Xiaoyu
AU  - Lehman, John
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-12-21 00:12:00
DO  - https://doi.org/10.6028/jres.117.019
LA  - en
M1  - 117
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - Optical-Fiber Power Meter Comparison between NIST and KRISS
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911350
ER  -