TY  - JOUR
AU  - Kruskopf, Mattias
AU  - Rigosi, Albert
AU  - Panna, Alireza
AU  - Patel, Dinesh
AU  - Jin, Hanbyul
AU  - Marzano, Martina
AU  - Berilla, Michael
AU  - Newell, David
AU  - Elmquist, Randolph
C2  - IEEE Transactions on Electron Devices
DA  - 2019-07-21 00:07:00
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2019
TI  - Two-terminal and multi-terminal designs for next generation quantized Hall resistance standards: contact material and geometry
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927830
ER  -