TY  - CONF
AU  - Veksler, Dmitry
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Zhong, J.
AU  - Zhu, H.
AU  - Zhao, C.
C2  - proceedings of 2016 IEEE International Reliability Physics Symposium, Pasadena, CA, US
DA  - 2016-04-16 04:04:00
LA  - en
PB  - proceedings of 2016 IEEE International Reliability Physics Symposium, Pasadena, CA, US
PY  - 2016
TI  - Device-Level Jitter as a Probe of Ultrafast Traps in High-k MOSFETs
ER  -