TY  - CONF
AU  - Caplins, Benjamin
AU  - Keller, Bob
AU  - Holm, Jason
C2  - Microscopy and Microanalysis, Baltimore, MD, US
DA  - 2018-07-31 04:07:00
LA  - en
PB  - Microscopy and Microanalysis, Baltimore, MD, US
PY  - 2018
TI  - Developing a Programmable STEM Detector for the Scanning Electron Microscope
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363
ER  -