TY  - CONF
AU  - Williams, Dylan
AU  - Chamberlin, Richard
AU  - Zhao, Wei
AU  - Cheron, Jerome
AU  - Miguel, Urteaga
C2  - IEEE Compound Semiconductor IC Symposium Digest, Austin, TX, US
DA  - 2016-10-22 04:10:00
LA  - en
PB  - IEEE Compound Semiconductor IC Symposium Digest, Austin, TX, US
PY  - 2016
TI  - The Role of Measurement Uncertainty in Achieving First-Pass Design Success
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921396
ER  -