TY  - CONF
AU  - Williams, Dylan
AU  - Chamberlin, Richard
AU  - Zhao, Wei
AU  - Cheron, Jerome
AU  - Miguel, Urteaga
C2  - International Microwave Symposium, San Francisco, CA, US
DA  - 2016-05-26 04:05:00
LA  - en
PB  - International Microwave Symposium, San Francisco, CA, US
PY  - 2016
TI  - Verification of a Foundry-Developed Transistor Model with Measurement Uncertainty
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919866
ER  -