TY  - CONF
AU  - Chbili, Jaafar
AU  - Chbili, Zakariae
AU  - Matsuda, Asahiko
AU  - Cheung, Kin
AU  - Ryan, Jason
AU  - Campbell, Jason
AU  - Lahbabi, M
C2  - 2017 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
DA  - 2018-01-31 05:01:00
LA  - en
PB  - 2017 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
PY  - 2018
TI  - Influence of Lucky Defect Distributions on Early TDDB Failures in SiC Power MOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924689
ER  -