TY  - JOUR
AU  - Hedden, R
AU  - Lee, Hae-Jeong
AU  - Bauer, Barry
C2  - Langmuir
DA  - 2008-10-16 14:10:19
LA  - en
PB  - Langmuir
PY  - 2008
TI  - Characterization of Nanoporous Low-K Thin Films by SANS Contrast Variation
ER  -