TY  - CONF
AU  - Drescher-Krasicka, E
AU  - Moore, T
AU  - Hartfield, T
AU  - Chery, D
C2  - International Conference on Characterization and Metrology for ULSI Technology, Undefined
DA  - 2008-10-16 14:10:19
LA  - en
PB  - International Conference on Characterization and Metrology for ULSI Technology, Undefined
PY  - 2008
TI  - Scanning Acoustic Microscopy Stress Measurements in Electronic Packaging
ER  -