TY  - JOUR
AU  - Lykke, Keith
AU  - Shaw, Ping-Shine
AU  - Dehmer, J
AU  - Gupta, R
C2  - Applied Physics Letters
DA  - 2008-10-16 14:10:14
LA  - en
PB  - Applied Physics Letters
PY  - 2008
TI  - Characterization of UV-Induced Radiation Damage to Si-based Photodiodes
ER  -