TY  - JOUR
AU  - Windsor, Eric
AU  - Jr., Bruce Benner
AU  - Fletcher, Robert A.
AU  - Gillen, J Greg
AU  - Lareau, R
AU  - Cho, Inho
AU  - Boldmand, Mike
C2  - Microscopy and Microanalysis
DA  - 2008-10-16 14:10:10
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2008
TI  - Trace Explosive Detection Standards Using Drop-on-Demand Inkjet Printing Technology
ER  -