TY  - JOUR
AU  - Newbury, Dale E.
C2  - Microscopy and Microanalysis
DA  - 2008-10-16 14:10:10
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2008
TI  - The New X-Ray Mapping: X-Ray Spectrum Imaging Above 100 kHz Output Count Rate With the Silicon Drift Detector
ER  -