TY - GEN AU - Bassham, Lawrence AU - Rukhin, Andrew AU - Soto, Juan AU - Nechvatal, James AU - Smid, Miles AU - Leigh, Stefan AU - Levenson, M AU - Vangel, M AU - Heckert, Nathanael AU - Banks, D C2 - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD DA - 2010-09-16 LA - en PB - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD PY - 2010 TI - A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906762 ER -