TY  - JOUR
AU  - Labenski, John
AU  - Tew, Weston
AU  - Nam, Sae
AU  - Benz, Samuel
AU  - Dresselhaus, Paul
AU  - Burroughs, Charles
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2007-04-01
LA  - en
M1  - 56
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2007
TI  - Resistance-Based Scaling of LF-and MF-Band Thermal Noise Powers
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=830971
ER  -