TY  - CONF
AU  - Benz, Samuel
AU  - Dresselhaus, Paul
AU  - Burroughs, Charles
C2  - Proc., Symp. on Microtech. in Metrol. and Metrol. in Microsys., Delft, NL
DA  - 2000-08-30
LA  - en
PB  - Proc., Symp. on Microtech. in Metrol. and Metrol. in Microsys., Delft, NL
PY  - 2000
TI  - Nanotechnology for Next-Generation Josephson Voltage Standards
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15244
ER  -