TY  - JOUR
AU  - Stan, Gheorghe
AU  - King, Sean
C2  - Journal of Vacuum Science and Technology B
DA  - 2020-11-10 05:11:00
LA  - en
PB  - Journal of Vacuum Science and Technology B
PY  - 2020
TI  - Atomic force microscopy for nanoscale mechanical property characterization
ER  -