TY  - CONF
AU  - Hossen, Imtiaz
AU  - Zang, Yi
AU  - Anders, Mark
AU  - Wang, Lin
AU  - Adam, Gina
C2  - 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Proceedings
, Oika, JP
DA  - 2022-06-21 04:06:00
DO  - https://doi.org/10.1109/EDTM53872.2022.9798256
LA  - en
PB  - 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Proceedings
, Oika, JP
PY  - 2022
TI  - Heteroscedastic Gaussian Process Regression for ReRAM Device Modeling
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933576
ER  -