TY  - CHAP
AU  - Pavlidis, Georges
AU  - Foley, Brian
AU  - Graham, Samuel
C2  - Thermal Management of Gallium Nitride Electronics, Elsevier, New York, NY
DA  - 2022-07-15 04:07:00
DO  - https://doi.org/10.1016/B978-0-12-821084-0.00018-4
LA  - en
PB  - Thermal Management of Gallium Nitride Electronics, Elsevier, New York, NY
PY  - 2022
TI  - Gate resistance thermometry: An electrical thermal characterization technique
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932168
ER  -