TY  - JOUR
AU  - Chen, Ruimin
AU  - Lu, Yan
AU  - Witherell, Paul
AU  - Simpson, Timothy
AU  - Kumara, Soundar
AU  - Yang, Hui
C2  - IEEE Journal Of Robotics And Automation
DA  - 2021-06-16 04:06:00
LA  - en
PB  - IEEE Journal Of Robotics And Automation
PY  - 2021
TI  - Ontology-driven Learning of Bayesian Network for Causal Inference and Quality Assurance in Additive Manufacturing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932380
ER  -