TY  - CONF
AU  - Amoah, Papa
AU  - Kopanski, Joseph J.
AU  - Obeng, Yaw S.
AU  - Sunday, Christopher
AU  - Okoro, Chukwudi
AU  - You, Lin
AU  - Veksler, Dmirty
C2  - ECS Transactions, volume 109 (issue 2), Atlanta, GA, US
DA  - 2022-09-30 04:09:00
DO  - https://doi.org/10.1149/10902.0041ecst
LA  - en
M1  - 109
PB  - ECS Transactions, volume 109 (issue 2), Atlanta, GA, US
PY  - 2022
TI  - Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935248
ER  -