TY  - CONF
AU  - Hopkins, Pete
AU  - Beltran, Manuel Castellanos
AU  - Biesecker, John
AU  - Dresselhaus, Paul
AU  - Fox, Anna
AU  - Howe, Logan
AU  - Olaya, David
AU  - Sirois, Adam
AU  - Williams, Dylan
AU  - Benz, Samuel P.
AU  - Boaventura, Alirio De Jesus Soares
AU  - Brevik, Justus
C2  - Proceedings of International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2022), Monterey, CA, US
DA  - 2022-06-23 04:06:00
LA  - en
PB  - Proceedings of International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2022), Monterey, CA, US
PY  - 2022
TI  - Measurement Challenges for Scaling Superconductor-based Quantum Computers
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934206
ER  -