TY  - GEN
AU  - Beauchamp, Carlos R.
AU  - Camara, Johanna
AU  - Carney, Jennifer
AU  - Choquette, Steven J.
AU  - Cole, Kenneth D.
AU  - DeRose, Paul C.
AU  - Duewer, David L.
AU  - Epstein, Michael
AU  - Kline, Margaret
AU  - Lippa, Katrice
AU  - Lucon, Enrico
AU  - Molloy, John L.
AU  - Nelson, Michael
AU  - Phinney, Karen W.
AU  - Polakoski, Maria
AU  - Possolo, Antonio
AU  - Sander, Lane C.
AU  - Schiel, John E.
AU  - Sharpless, Katherine E.
AU  - Winchester, Michael R.
AU  - Windover, Donald
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2021-09-16 04:09:00
DO  - https://doi.org/10.6028/NIST.SP.260-136-2021
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2021
TI  - Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933027
ER  -