TY  - JOUR
AU  - Berweger, Samuel
AU  - Wallis, Thomas Mitchell (Mitch)
AU  - Kabos, Pavel
C2  - IEEE Microwave Magazine
DA  - 2020-09-04 04:09:00
LA  - en
PB  - IEEE Microwave Magazine
PY  - 2020
TI  - Nanoelectronic Characterization using Microwave Near-Field Microscopy
ER  -