TY  - JOUR
AU  - Braun, Trevor
AU  - Josell, Daniel
AU  - Moffat, Thomas P.
C2  - Journal of the Electrochemical Society
DA  - 2020-12-16 05:12:00
LA  - en
PB  - Journal of the Electrochemical Society
PY  - 2020
TI  - Simulation of Copper Electrodeposition in Millimeter Size Through-Silicon Vias
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930972
ER  -