TY  - JOUR
AU  - Shrestha, Pragya
AU  - Akturk, Akin
AU  - Hoskins, Brian
AU  - Madhavan, Advait
AU  - Campbell, Jason
C2  - IEEE Journal of the Electron Devices Society
DA  - 2023-03-21 04:03:00
DO  - https://doi.org/10.1109/JEDS.2023.3259823
LA  - en
M1  - 11
PB  - IEEE Journal of the Electron Devices Society
PY  - 2023
TI  - Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932679
ER  -