TY  - JOUR
AU  - Moxim, Stephen
AU  - Ashton, James P
AU  - Anders, Mark
AU  - Ryan, Jason
C2  - Journal of Applied Physics
DA  - 2023-04-12 04:04:00
DO  - https://doi.org/10.1063/5.0145937
LA  - en
M1  - 133
PB  - Journal of Applied Physics
PY  - 2023
TI  - Combining Electrically Detected Magnetic Resonance Techniques to Study Atomic-Scale Defects Generated by Hot-Carrier Stressing in HfO2/SiO2/Si Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936117
ER  -