TY  - JOUR
AU  - Meng, Jingjia
AU  - Goodwill, Jonathan
AU  - Strelcov, Evgheni
AU  - Bao, Kefei
AU  - McClelland, Jabez J.
AU  - Skowronski, Marek
C2  - ACS Applied Electronic Materials
DA  - 2023-04-10 04:04:00
DO  - https://doi.org/10.1021/acsaelm.3c00229
LA  - en
M1  - 5
PB  - ACS Applied Electronic Materials
PY  - 2023
TI  - Temperature Distribution in TaOx Resistive Switching Devices Assessed In Operando by Scanning Thermal Microscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936288
ER  -