TY  - CONF
AU  - Postek, Michael
AU  - Cavanagh, Richard
AU  - Allocca, C
AU  - Smith, Douglas
AU  - Shull, Robert
AU  - Wollman, David
AU  - Seiler, David
AU  - Knight, Stephen
AU  - Diebold, A
AU  - Silver, Richard
AU  - Clark, Charles
AU  - Lyons, Kevin
AU  - Whetstone, James
AU  - Boisvert, Ronald
C2  - National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, Gaithersburg, MD
DA  - 2006-08-01
LA  - en
PB  - National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, Gaithersburg, MD
PY  - 2006
TI  - National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
ER  -