TY  - CONF
AU  - Phillips, Steven
AU  - Borchardt, Bruce
AU  - Sawyer, Daniel
AU  - Estler, William
AU  - Ward, David
AU  - Eberhardt, K
AU  - Levenson, M.
AU  - McClain, Marjorie
AU  - Melvin, B
AU  - Hopp, Ted
AU  - Shen, Y
C2  - Proceedings of American Society for Precision Engineering, Norfolk, VA
DA  - 1997-01-01
LA  - en
PB  - Proceedings of American Society for Precision Engineering, Norfolk, VA
PY  - 1997
TI  - The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
ER  -