TY  - CONF
AU  - Kelley, Edward
C2  - Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Flat Panel Display Technology and Display Metrology, San Jose, CA
DA  - 1999-01-01
LA  - en
PB  - Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Flat Panel Display Technology and Display Metrology, San Jose, CA
PY  - 1999
TI  - Simulated-eye-design Camera for High-contrast Measurements
ER  -