TY  - CONF
AU  - Lee, Kevin
C2  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
DA  - 1998-07-01
LA  - en
PB  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
PY  - 1998
TI  - Dependence of Contact Resistance on Current for Good and Bad Ohmic Contacts to Quantized Hall Resistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15798
ER  -