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Gaithersburg

Placing Single Nanowires: NIST Makes the Connection

April 26, 2007

Researchers at the National Institute of Standards and Technology (NIST) have devised a system for manipulating and precisely positioning individual nanowires

Micrograph of a complete nanowire LED with the end contact

New Fabrication Technique Yields Nanoscale UV LEDs

May 24, 2007

Researchers at the National Institute of Standards and Technology (NIST), in collaboration with scientists from the University of Maryland and Howard University

New Design Developed for Silicon Nanowire Transistors

June 30, 2005

In an advance for nanoscale electronics, researchers at the National Institute of Standards and Technology (NIST) have demonstrated a new design for silicon

Gold Nano Anchors Put Nanowires in Their Place

November 10, 2004

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a technique for growing well-formed, single-crystal nanowires in

NIST Demos Industrial-Grade Nanowire Device Fabrication

October 25, 2007

In the growing catalog of nanoscale technologies, nanowires—tiny rows of conductor or semiconductor atoms—have attracted a great deal of interest for their

Green Concrete Performance One-Day Workshop

Fri, Jul 20 2012

The National Institute of Standards and Technology will conduct a one-day workshop to support the expanded use of

Fingerprint Vendor Technology Evaluation (FpVTE)

The Fingerprint Vendor Technology Evaluation (FpVTE) is an independently administered technology evaluation of fingerprint matching, identification, and

Forensics@NIST 2012

June 4, 2012

On November 28 – 30, 2012, OLES will be hosting Forensics@NIST 2012, a symposium for industry, government, and academic representatives to learn about cutting

Atom Manipulation with the Scanning Tunneling Microscope

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. Typically

The Quest for Knowledge

April 2012 At the annual Quest for Excellence® conference, I am always amazed at how openly the Baldrige Award winners share their...

STM image of the surface states of a topological insulator - 3D perspective

Measuring Topological Insulator Surface State Properties

The transmission of information in today's electronics requires the movement of electrical charge, which expends energy and generates heat, creating two

Contaminants, Water and Human Health: New Lessons from Alligators

Fri, Jun 15 2012

Many chemicals introduced into the environment by humans adversely affect embryonic development of animals, including

Quantum Computers Will Be Able to Simulate Particle Collisions

May 31, 2012

Quantum computers are still years away, but a trio of theorists has already figured out at least one talent they may have. According to the theorists, including

Measurements and Standards for Botanical Dietary Supplements

As part of a multi-year interagency agreement among the National Institute of Standards and Technology (NIST), the National Institutes of Health's Office of

Webinar - Traceability Assessments for Weights and Measures

Thu, Jun 28 2012

This 2 hour webinar will introduce metrological traceability. Metrological traceability is a characteristic of a

Federal Funding for Advanced Manufacturing Regional Partnerships

May 29, 2012

On Thursday, May 24, 2012, the Obama Administration announced a $26 million federal funding opportunity for the multiagency Advanced Manufacturing Jobs and

SRM 2907: Reference Material for Explosive Traces

New NIST SRM Supports the Fight Against Terrorist Bombings

May 29, 2012

The National Institute of Standards and Technology (NIST) has released a new standard reference material (SRM) to aid in the detection of two explosive

A technician swabs for microbes on a mockup of the interior of the International Space Station at NASA's Kennedy Space Center in Florida.

Report Details Efforts to Improve, Advance Indoor Microbial Sampling

May 29, 2012

Humans spend greater than 90 percent of their time indoors, but we're never alone there. Bacteria and viruses, scientists estimate, make up half of the world's

Picture of the results of the Standard Test Method for Measuring the Ignition Strength of Cigarettes (ASTM E2187)

Nationwide Adoption of NIST-Developed Test Predicted to Cut Death Toll Due to Cigarette-Caused Fires

May 29, 2012

In 2003, New York became the first state requiring cigarettes sold within its borders to pass a fire safety standard based on a test developed by the National

NIST Special Publication Helps to Demystify Cloud Computing

May 29, 2012

For a clear view of cloud computing, the National Institute of Standards and Technology (NIST) has issued a new publication that explains cloud systems in plain

New Cybersecurity Center Kicks Off with Workshop

May 29, 2012

The National Cybersecurity Center of Excellence (NCCoE) will host a kickoff workshop on Tuesday, June 26, 2012. The workshop's goal is to introduce the center

Intel Executive Joins NIST Advisory Committee

May 29, 2012

Under Secretary of Commerce for Standards and Technology and National Institute of Standards and Technology (NIST) Director Patrick Gallagher has selected

NIST Earns Honor for Work Supporting Information Exchange Across Supply Chains

May 29, 2012

The Open Application Integration Group (OAGi), a U.S.-based, nonprofit consortium, has recognized the Systems Integration Division at the National Institute of

CNST Releases the Spring 2012 Edition of The CNST News

May 25, 2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the spring 2012 edition of The CNST News. This quarterly

Metrics for Manipulation and Enhancements of Forensic Images

Latent fingerprints are, by definition, left unintentionally and are obtained using diverse physical and chemical techniques. It follows that the initial

BIG DATA Workshop

Wed, Jun 13 - Thu, Jun 14 2012

In the March 2012 unveiling of the BIG DATA Initiative, Dr. John P. Holdren, Assistant to the President and Director of

NIST Exhibits at the International Manufacturing Technology Show 2012

Mon, Sep 10 - Sat, Sep 15 2012

The International Manufacturing Technology Show (IMTS) is the largest manufacturing technology show in the Western

NIST engineer Kate Remley holds two Personal Alert Safety System (PASS) devices with wireless alarm capability.

Improving Safety Measures and Measures of Safety for World Metrology Day 2012

May 17, 2012

World Metrology Day celebrates the signing of the Treaty of the Meter on May 20, 1875.* By signing the treaty, representatives from 17 nations, including the

New Commitments Support Administration's Materials Genome Initiative

May 14, 2012

Today, at a White House event, leaders from industry, academia, national labs, and government announced more than a dozen new commitments to advance the

NIST Forensic Measurement Challenge

May 14, 2012

Recently, NIST announced the availability of $2.5 million for funding criminal justice applications that use new scientific discoveries. Thirty-six proposals