Secondary Electron (Se) Imaging
Imaging using low-energy electrons produced from the interaction of beam electrons and conduction band electrons of atoms within the interaction volume, with only those near the surface having sufficient energy to escape.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2022.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org