Escape Peak
a spectral artifact resulting from incomplete deposition of the energy of an X-ray entering the energy dispersive X-ray spectrometer detector.
Discussion—An escape peak is produced when an incoming X-ray excites a silicon atom within the detector crystal, and the resulting Si Kα fluorescence X-ray exits the detector crystal. It occurs at the energy for the original X-ray minus the energy of the Si Kα fluorescence X-ray (1.74 keV). The escape peak intensity is about 1-2 % of the parent peak.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E3295-23 Standard Guide for Using Micro X-Ray Fluorescence (μ-XRF) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428 , 2023.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org