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Overcoming Barriers: Nanoscale Interface Metrology and Electrical Characterization for Advanced Electronics

Ongoing

“The interface is the device,” Herbert Kroemer, 2000 Nobel Laureate. This is even more true today, twenty-three years later, when device dimensions are measured in numbers of atoms rather than numbers of micrometers. Historically, interface problems in the semiconductor industry have been addressed

Quantitative Assessment of Defects and Related Modeling Parameters in GaN Semiconductor Devices

Ongoing

Key performance metrics like breakdown voltage, switching speed, gain stability, and maximum operating frequency are limited by material defects in AlGaN/GaN devices. Defects also play a role in device degradation over time. Although these materials have been studied for over twenty years with a

Images depicting an advanced analysis of HR-EBSD data

Strain Measurement for Semiconductor Devices and Packages

Ongoing

Strain is a critical parameter that influences both electrical and mechanical failures of devices, however, measuring strain in complex 3D geometries and vanishingly small feature sizes remains a challenge for manufacturers. Data provided by strain measurements can be used to validate computational

Thermoreflectance Thermal Property Measurements for Heterogeneously Integrated Materials and Power Electronics

Ongoing

Thermal conductivity, heat capacity, and interface conductance are fundamental properties that govern semiconductor microelectronic devices, from materials discovery, to design and modeling, thermal management and device performance, and ultimately device reliability and operational lifespan. These

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Ongoing

When a new integrated circuit is fabricated, it is necessary to measure the chip with microscopy techniques such as photon emission microscopy, which look at infrared photons emitted by electrons accelerated in transistor channels. TREM, also referred to as picosecond imaging circuit analysis, is a

Advanced communications
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