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Projects/Programs

Displaying 1 - 10 of 10

Advanced Microscopy for Trace and Bulk Particle Characterization

Ongoing
The goal of this project is to help develop innovative metrologies and measurement protocols for micro/nano-scale analysis of particles. In this project, state-of-the-art optical and electron-based microscopy are used to conduct research for quantitative and qualitative analysis of chemical

Analysis of Copper Incorporation Into Zinc Oxide Nanowires

The lasing capabilities and piezoelectric properties of single ZnO nanowires offer promise for future technologies. However, the photoluminescence of ZnO nanowires differs depending upon the synthesis method and the defects present in the sample. This project was undertaken to characterize zinc

Analysis and Modeling of Atmospheric Particles to Assess Effects on Climate

Completed
Spectral data from satellite and ground-based remote sensing instruments are used to monitor the effects of atmospheric aerosols on climate. Determinations of how aerosols interact with sunlight or infrared radiation from Earth’s surface rely upon an aerosol model that approximates the sizes, shapes

Metrology for Nanomaterials in Medicine

Ongoing
Drug products that incorporate nanomaterials are defined by FDA as non-biological complex drugs (NBCDs). NBCDs are a class of medical products that cannot be defined nor fully identified as traditional small-molecule drugs. NBCDs consist of different components that form a complex hybrid structure

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our

Nanomaterials in consumer products

Ongoing
Nanomaterials (e.g. carbon nanotubes; silver, gold, copper and silica nanoparticles) are increasingly employed into new and existing consumer products for their novel or improved properties that they can impart. Nano-enabled products, like all products, have stages in their lifecycle of use

Nanometer-Scale Planar Reference Materials

Ongoing
In most industrial fabs today, foundry test artifacts (wafers) are used to test metrology tools and monitor process stability. These wafers are made in partnerships between specific materials providers and metrology tool providers and may have limited or no adoption across foundries. In some