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Projects/Programs

Displaying 26 - 50 of 60

Magnetic Materials Metrology

Ongoing
Our aim is to develop the metrology for control and manipulation of magnetic anisotropy in magnetic materials. This includes development of the measurement science for quantification of the magnetic properties (e.g., magnetic anisotropy, magnetic exchange) and the structure-property-processing

Magnetic Nanostructures for post-CMOS Electronics

Completed
We focus primarily on arrays of magnetic nanostructures in order to reveal how defects alter the fundamental physics of magnetization reversal processes in the nanometer regime. We have an integrated approach that consists of four inter-related elements. The first element, film edge metrology

Material Qualification

Ongoing
Objective To develop, utilize, and analyze methods of characterizing the precursor materials in additive manufacturing in both virgin and recycled states with the goal of advancing measurement science to benefit the AM community. The components of principal interest will include the rheological

Materials Informatics

Ongoing
To develop the need data infrastructure and informatics tools, NIST is focusing on three areas: data curation, data infrastructure, and data access. Data curation efforts include efforts to develop a phase-based materials ontology to ensure that the data is represented in a semantically

Measurements of Point-Defect Chemistry in Complex Oxides

Ongoing
Project Goal: To develop magnetic resonance, x-ray absorption, electron diffraction, and electrical conductivity measurements to better characterize dilute concentrations of point defects in oxide materials and effectively correlate electro-mechanical properties to measured defect chemistry. Oxide

Measuring Topological Insulator Surface State Properties

Ongoing
A family of TI materials can by synthesized by combining binary compounds of Bismuth (Bi) or Antimony (Sb) with Selenium (Se) and Tellurium (Te) to form Bi 2Se 3, Bi 2Te 3, and Sb 2Te 3 compounds. In these material compounds the spin of the electron has a strong interaction with the motion of the

Metrics for Reactive Wetting in Complex Systems

Completed
From fundamental physical considerations, we have derived a set of partial differential equations describing wetting and spreading. These equations are derived using a variational thermodynamic principle applied to a two-component alloy system with three (vapor, liquid and solid) phases. The method

Metrology of Magnetic Materials

Ongoing
Currently, the bulk of this project is focused on three main pieces: Thermal MagIC: An SI-Traceable Method for 3D Thermal Magnetic Imaging and Control Magnetic Refrigeration Magnetic Standard Reference Materials (SRMs) Thermal MagIC (MAGnetic Imaging and Control) is focused on developing new

Metrology for Multi-Physics AM Model Validation

Completed
Objective To provide reference data for the validation of multi-physics models of metal additive manufacturing processes to enable improvement of AM process models and more rapid and predictable process development for AM production by manufacturers. What is the Technical Idea? The Metrology for

Metrology for Real-Time Monitoring of Additive Manufacturing

Completed
Objective To develop and disseminate metrology methods, tools, data, and standards applied to in-situ monitoring of AM processes, such that manufacturers and their customers can accurately and precisely determine the quality of the fabrication process and resulting parts. What is the Technical Idea

Microscopy Methods

Completed
Due to projection effects, analytical transmission electron microscopy (AEM) of thinned or sectioned samples has traditionally been limited to essentially two-dimensional imaging and analysis. Current nanometer scale devices are too small and complex for current sectioning capabilities and two

Microstructure-Property Tools for Structure-Property Design

Ongoing
Microstructure-level Structure-Property Tools OOF: Finite Element Analysis of Microstructures enables materials scientists calculate macroscopic properties from images of real or simulated microstructures. It reads an image, assigns material properties to features in the image, and conducts virtual

Microsystems for Harsh Environment Testing

Completed
Classically, measurement of the mechanical properties and reliability of bulk-scale materials is performed with macroscopic specimens and methods. Specimen preparation limitations, miniaturized load-frame tooling problems, and inadequate understanding of the roles of specimen size and constraint on

Multifunctional 3D Printable Polymer-Metal Composites

Ongoing
Recent advances in additive manufacturing (AM) have positioned metals and polymers as two key materials. Typically, AM of these two materials involves incompatible methods and conditions. The novel multifunctional polymer-metal composites in this project incorporate low-melting alloys with

Multiscale structure and dynamics in advanced technological materials

Ongoing
New technologies increasingly harness materials phenomena that operate across many length-scales: e.g., in selective gas adsorption, additive manufacturing, new alloy designs, or advanced concretes. To overcome technology barriers, it is no longer sufficient just to characterize the materials

Nanocalorimetry Measurements

Ongoing
Accurate thermodynamic measurements are essential to understand fundamental properties of materials, providing direct and quantifiable insight into the thermodynamics of thin film reactions and phase transitions. Going forward, new classes of materials may only be synthesized as thin films, a scale

Nanomagnet Dynamics

Ongoing
The motion of the magnetization in magnetic nanostructures is at the core of important technologies such as computer hard drives and magnetic memory chips. Additionally, emerging technologies such as magnetic logic and second-generation spin-torque memory chips write and read "bits" of information

Nanoplasmonics and Three-Dimensional Plasmonic Metamaterials

Ongoing
Plasmonic materials are composed of metals and insulators that are ordered in geometric arrangements with dimensions that are fractions of the wavelength of light. Research groups are experimenting with a variety of geometric approaches, but all aim to exploit surface plasmons, which are light

Physical Infrastructure: Connections

Completed
The NIST Physical Infrastructure Program will provide the critical measurement science needed to assess the condition of aging physical infrastructure and guide cost-effective strategies for its maintenance, repair, and replacement. Infrastructure management challenges in the U.S. have received

Precision Materials for Quantum Devices

Ongoing
MBE System Our fabrication system is composed of ultra-high vacuum (UHV) chambers that support the in-vacuum exchange of 75 mm wafers without exposure to air as seen in Figure 1. These chambers are: (1) a deposition chamber with electron gun deposition, UHV compatible sputter guns, in situ shadow

Precision X-ray Emission Line Measurements

Ongoing
Precise knowledge of the shape and position of x-ray emission lines is the basis of connecting x-ray diffraction measurements to the Système Internationale d'Unités (SI), the official worldwide standard for making any measurement. Measurements of position of x-ray emission lines have been made been

Precursor Material Qualification

Completed
To develop, utilize, and analyze methods of characterizing the precursor materials in additive manufacturing in both virgin and recycled states with the goal of advancing measurement science to benefit the AM community. The components of principal interest will include the rheological, size

Qualification for AM Feedstocks, Machines and Processes

Completed
Objective - To develop, utilize, and analyze test methods and protocols for characterizing the feedstocks, machines, and processes in metal-based additive manufacturing to enable optimum usage and to reduce the cost and time needed for qualification. What is the Technical Idea? Qualification of AM

Quantifying the environmental contributions to mass change

Ongoing
Experiments using two types of centimeter scale oscillators are described: the double paddle oscillator (DPO) and a commercial quartz crystal microbalance (QCM). Double Paddle Oscillator (DPO) Since mass changes are mostly on the surface of mass artifacts, we have implemented a micro-weighing sensor