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Local, near-field probing is a powerful technique for studying electromagnetic material properties with sub-wavelength resolution. In turn, near-field scanning probe microscopy impacts fundamental research and applications in a wide variety of fields, including quantum materials, low-dimensional systems, superconductivity, biological systems, and nanoscale fabrication. To date, the most prominent near-field probing results have been in the visible and near- to mid-infrared regimes. Near-field probing at longer wavelengths – including the microwave, mm-wave/THz, and far-infrared regimes – is less mature, but presents broad, emerging research opportunities in quantitative electromagnetic material and device characterization. This workshop will bring together researchers in microwave, THz, and far-infrared scanning probe microscopy to share breakthroughs in research, exchange ideas about this emerging field, and encourage new collaborations.
Join researchers from academia, industry, and government laboratories for this two-day workshop on all aspects of near-field, high frequency scanning probe microscopy from microwaves through THz and to the far-infrared.
08:00 to 17:30 MT on December 12
08:00 to 12:00 MT on December 13
Final Schedule, High Frequency Scanning Probe Microscopy Workshop
NIST Boulder, December 12-13
|
Day |
Session |
Start Time |
End Time |
Speaker |
Title |
|
December 12 |
Breakfast Available |
8:00 |
9:00 |
Breakfast |
|
|
8:30 |
8:40 |
Mitch Wallis / Kristan Corwin / Sam Berweger, NIST |
Opening Remarks / Announcements |
||
|
Session One |
8:40 |
9:20 |
Keji Lai, U. of Texas, Austin |
Probing Spatial and Temporal Dynamics of Photo-generated Carriers by Microwave Microscopy |
|
|
9:20 |
9:45 |
David Scrymgeour, Sandia |
Scanning microwave impedance microscopy of buried dopant nanostructures in silicon |
||
|
9:45 |
10:10 |
Joanna Atkin, U. of North Carolina |
Near-field optical spectroscopy for the study of electronic properties in semiconducting nanostructures |
||
|
Break |
10:10 |
10:40 |
Break |
||
|
Session Two |
10:40 |
11:20 |
Yasuo Cho, Tohoku U. |
High resolution characterizations of fine structure of electric devices and materials using scanning nonlinear dielectric microscopy |
|
|
11:20 |
11:45 |
Hans Bechtel, LBNL |
Broadband Synchrotron Infrared Nanospectroscopy |
||
|
11:45 |
12:10 |
Holger Thierschmann, TU Delft |
Towards a scanning THz impedance microscope |
||
|
Lunch |
12:10 |
13:00 |
Lunch |
||
|
Session Three |
13:00 |
13:40 |
Alex McLeod, Columbia |
Developments and applications in low-temperature nano-imaging |
|
|
13:40 |
14:05 |
Yong-Tao Cui, UC-Riverside |
Imaging 2D Topological Systems by Microwave Impedance Microscopy |
||
|
14:05 |
14:30 |
Olaf Haenssler, Oldenburg |
Multimodal Sensing and Imaging Technology by Integrated Scanning Electron, Force, and Nearfield Microwave Microscopy |
||
|
Break/Posters |
14:30 |
15:15 |
Break/Posters |
||
|
Session Four |
15:15 |
15:40 |
Ravi Chintala, PrimeNano |
Advances in scanning microwave impedance microscopy |
|
|
15:40 |
16:05 |
Tyler Cocker, Michigan State |
Ultrafast terahertz microscopy: from near fields to single atoms |
||
|
16:05 |
17:30 |
Posters |
|||
|
December 13 |
Breakfast Available |
8:00 |
9:00 |
Breakfast |
|
|
8:30 |
8:35 |
Opening Remarks / Announcements |
|||
|
Session Five |
8:35 |
9:15 |
Markus Raschke, U. of Colorado, Boulder |
Ultrafast and nonlinear nano-optical imaging and control of quantum dynamics in time and space |
|
|
9:15 |
9:40 |
Marco Farina, U. Politecnica delle Marche |
On the Inverted Near-Field Scanning Microwave Microscope |
||
|
9:40 |
10:05 |
Fabian Mooshammer, Regensburg |
Ultrafast multi-THz nanoscopy of van der Waals materials |
||
|
Break |
10:05 |
10:35 |
Break |
||
|
Session Six |
10:35 |
11:00 |
Bill Wilson, Harvard |
Scan-probe Spectroscopy/Microscopy of Quantum Materials: Spatially Resolved Quasiparticle Dynamics probed at the Nanoscale |
|
|
11:00 |
11:25 |
Alex Tselev, U. of Aveiro |
Near-field microwave microscopy in application to in situ subsurface imaging and characterization |
||
|
11:25 |
11:50 |
Johannes Hoffmann, METAS |
Standards and Coaxial Tips for Scanning Microwave Microscopy |
||
|
11:50 |
12:00 |
Steve Anlage, U. of Maryland |
Closing Remarks |
||
|
Lunch |
12:00 |
Lunch |
Presented Posters
“Infrared Optical Nano-Crystallography and Chemical Nano-Imaging,” by Hans Bechtel, Connor Bischak, Sven Donges, Naomi Ginsburg, Thomas Gray, Omar Khalib, Simon Labouesse, Liant-Chun Lin, Mike Martin, Andrew Minor, Eric Muller, Jun Nishida, Ben Pollard, Markus Raschke, and Steven Zeltman
“Ultrafast nano-imaging and nonlinear nano-optics,” by Tao Jiang, Yijian Cai, Vasily Kravtsov, Fabian Menges, and Markus Raschke
“High Frequency Near-Field Magnetic Microscope,” by Bakrom Oripov and Steven Anlage
“In liquid infrared scattering scanning near-field optical microscopy for chemical and biological nano-imaging,” by Brian O’Callahan, Kyoung-Duck Park, Irina Navikova, Tengyue Jian, Chun-Long Chen, Patrick Z. El-Khoury, Markus Raschke, and A. Scott Lea
“Quantitative Measurement and Traceability of Scanning Microwave Microscope (SMM) based on Atomic Force Microscopy (AFM),” by Masahiro Horibe
“Guideline for On-Wafer Microwave Characterization of 1D Materials,” by K. Daffe, Y. Coffiner, I. Roch-Jeune, C. Boyaval, G. Dambrine, and K. Haddadi
“Laser Scanning Microscopy for Imaging gap symmetry of unconventional superconductors and collective modes of a SQUID array,” Seokjin Bae, Alexander P. Zhuravel, and Steven Anlage
“The inverted near-field scanning microwave microscope,” by Gianluca Fabi, C. H. Joseph, Eleonora Pavoni, Xin Jin, Xiaopeng Wang, Davide Mencarelli, Andrea di Donato, Antonio Morini, Yan Zhao, Richard Al Hadi, James C. M. Hwang, and Marco Farina
“Disentangling topographic effects from Near-field Scanning Microwave Microscopy Images,” by K. J. Coakley, S. Berweger, T. M. Wallis, and P. Kabos
“Imaging free carriers in 2D materials using Microwave Near-Field Microscopy,” by Sam Berweger, T. Mitch Wallis, and Pavel Kabos
Best Western Plus Boulder Inn -
Rates from $119
Arrival Date: Wednesday, December 11, 2019
or Group code: call 800-233-8469 and reference code " NIST Radio Frequency Workshop "
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
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