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CHIPS Metrology Community

CHIPS for America Metrology Community in blue text with a blue to red gradient line

Introducing the new CHIPS Metrology Community for advancing metrology for semiconductors and microelectronics. Hear how we’ll work to advance breakthrough measurements that are accurate, precise, and fit-for-purpose to produce microelectronic materials, devices, circuits, and systems, and learn about future engagement opportunities for industry and academia to identify relevant metrology problems; share key research and knowledge; and develop practical solutions together through the community.

official photo of Marla L. Dowell
Credit: NIST

Marla Dowell

Director of CHIPS Metrology Program and NIST Boulder Laboratory

paul_hale

Paul Hale

Deputy Director, CHIPS Metrology

Additional speakers include Rebecca Rouston and Isvar Cordova

Created August 15, 2024, Updated August 28, 2024