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Electronics

Semiconductors

News and Updates

Keyword

Organization

PML Leadership Prominent Throughout Newly Released ITRS

April 24, 2014

When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of

JILA Physicists Discover 'Quantum Droplet' in Semiconductor

February 26, 2014

JILA physicists used an ultrafast laser and help from German theorists to discover a new semiconductor quasiparticle—a handful of smaller particles that briefly

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers

January 15, 2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for

Microscopy Technique Could Help Computer Industry Develop 3-D Components

June 25, 2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a

New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics

October 16, 2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a collaboration of

NIST 'Hybrid Metrology' Method Could Improve Computer Chips

September 5, 2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry

September 5, 2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on "Flexible Printed Electronics

PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures

August 13, 2012

That graphene is the hot new material in the world of future electronics manufacturing is well known. With its high carrier mobility and low noise, graphene is

A microfluidic lab on a chip device sitting on a polystyrene dish.

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization

August 8, 2012

Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few microliters (millionth of a

Three NIST Researchers Earn Presidential Honor

July 25, 2012

The White House has announced that three researchers at the National Institute of Standards and Technology (NIST) will receive the 2011 Presidential Early

Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator

July 11, 2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally demonstrated surface

Shaffique Adam Receives Singapore National Research Foundation Fellowship

June 27, 2012

Shaffique Adam, an NRC Postdoctoral Research Associate in the NIST Center for Nanoscale Science and Technology, has been awarded a 2012 Singapore National

NIST Announces $2.6 Million in Funding for Novel Semiconductor Research

March 20, 2012

The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor technology

NIST Reveals Switching Mechanism in Promising Computer Memory Device

February 21, 2012

Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from the National

Laying the Groundwork for 3D Stacked Integrated Circuits

February 17, 2012

Could three-dimensional stacked integrated circuits (3DS-ICs) be the next big innovation in technology development? Imagine layer upon layer of integrated

CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials

February 15, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent experimental

PML's Pernstich Develops Open-Source Software to Automate Test Equipment

February 6, 2012

A free, easily customizable software program for automating test equipment via GPIB or RS232 bus may sound too good to be true, especially for smaller companies

NIST Sensor Improvement Brings Analysis Method into Mainstream

December 20, 2011

An advance in sensor design by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's Institute of Quantum

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

December 9, 2011

A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry's most vexing problems

NIST Measures Key Property of Potential 'Spintronic' Material

October 19, 2011

An advanced material that could help bring about next-generation "spintronic" computers has revealed one of its fundamental secrets to a team of scientists from

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