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Metrology

News and Updates

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SIM Metrology School at NIST

November 4, 2013

They spanned 140 degrees of latitude – from Canada to Chile – and varied widely in age and experience. But their goal was the same: To improve their

Force to be Reckoned With: NIST Measures Laser Power with Portable Scale

October 22, 2013

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a novel method for measuring laser power by reflecting the light off

NIST Carbon Nanotube Chips Go Ballooning for Climate Science

October 22, 2013

A huge plastic balloon floated high in the skies over New Mexico on Sept. 29, 2013, carrying instruments to collect climate-related test data with the help of

Quantum Voltage Standard Delivered to BIPM

October 17, 2013

A PML team has delivered a state-of-the-art 10 V voltage standard to the International Bureau of Weights and Measures (BIPM), where it will serve as the

NIST Unveils Prototype Video Imaging System for Remote Detection of Hidden Threats

September 30, 2013

By adapting superconducting technology used in advanced telescope cameras, researchers at the National Institute of Standards and Technology (NIST) have built a

NIST Awards $7.4 Million in Grants for Additive Manufacturing Research

September 19, 2013

The National Institute of Standards and Technology (NIST) today announced the award of two grants totaling $7.4 million to fund research projects aimed at

Image output from a 3D laser scanning measurement system.

Collaboration with Industry Leads to Improved Forensics Work and Industry Growth

August 20, 2013

Three-dimensional (3D) scanners used at crime scenes for forensic investigations are not just the stuff of prime time television. Investigators and crime

Yuqin Zong with LED timetime test enclosure

LEDs Get a Life Sentence

August 15, 2013

The light-emitting diode (LED) appears on track to become the light of our lives. Switching to bright, energy-efficient, durable, and environmentally friendly

New NIST Nanoscale Indenter Takes Novel Approach to Measuring Surface Properties

July 23, 2013

Researchers from the National Institute of Standards and Technology (NIST) and the University of North Carolina have demonstrated a new design for an instrument

New NIST Standard Reference Material to Help Calibrate Hospital CAT Scanners

July 23, 2013

Scientists at the National Institute of Standards and Technology (NIST) have developed a new standard reference material (SRM), the first such measurement tool

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for

High-Efficiency Photon Source Brings Day of Reckoning Closer for a Famous Quantum Test

June 25, 2013

Physicists working at the National Institute of Standards and Technology (NIST) and the Joint Quantum Institute (JQI) are edging ever closer to getting really

MRI Phantoms: Moving to the Next Stage

June 21, 2013

Magnetic resonance imaging (MRI) has become an indispensable tool for diagnosing, treating, and understanding a host of medical conditions, and the technology

New AC Voltage Devices: Factor of Three Improvement in Uncertainty

June 18, 2013

After years of effort and scores of iterations, PML researchers have developed a new generation of devices that can reduce the uncertainties in ac voltage

Closing the Last Bell-test Loophole for Photons

June 3, 2013

An international team of researchers has reached a milestone in experimental confirmation of a key tenet of quantum mechanics, using ultra-sensitive photon

A NIST team has created an ultraviolet (UV) metamaterial formed of alternating nanolayers of silver (green) and titanium dioxide (blue)

The Better to See You With: Scientists Build Record-Setting Metamaterial Flat Lens

May 23, 2013

For the first time, scientists working at the National Institute of Standards and Technology (NIST) have demonstrated a new type of lens that bends and focuses

New NIST Reference Materials for MEMS devices

New NIST Measurement Tool Is On Target for the Fast-Growing MEMS Industry

April 30, 2013

As markets for miniature, hybrid machines known as MEMS grow and diversify, the National Institute of Standards and Technology (NIST) has introduced a long

In Natural Gas Pipelines, NIST Goes with the Flow

April 19, 2013

On an ordinary day, the United States consumes about 70 billion cubic feet of natural gas – enough to fill a space a mile long, a mile wide, and half a mile

Webcast Planned for June Workshop on Lyme Disease Measurement

April 17, 2013

Getting Lyme disease may be easy—the tick-transmitted illness is the most common vector-borne disease in the United States—but accurately identifying it during

A Primary Voltage Standard for the Whole World

April 4, 2013

PML researchers are on the verge of reaching a long-sought major goal: Providing the world with a programmable quantum voltage standard that has an uncertainty

Seeing the Oceans in Their True Colors

April 3, 2013

Much of what is known about the state of the Earth's oceans, and how they change over time, comes from satellite monitoring of reflected and thermally emitted

NIST Boulder researcher Johannes (Hannes) Hubmayr

NIST Goes to the End of the Earth for Measurement Science

April 3, 2013

NIST Boulder researcher Johannes (Hannes) Hubmayr recently spent several weeks at the South Pole Telescope, where he optimized the performance of a NIST camera

Single Photon from a Quantum Emitter? It's a Matter of Timing...

April 3, 2013

Many systems envisioned for practical quantum information processing require the use of single, indistinguishable photons as carriers of information and logic

NIST Tests Underscore Potential Hazards of Green Laser Pointers

March 20, 2013

Using a low-cost apparatus designed to quickly and accurately measure the properties of handheld laser devices, National Institute of Standards and Technology

PML Scientists Make Better SEM Imaging and Measurements in the Nano Era Possible

March 14, 2013

Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for

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