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Nanotechnology

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Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy

October 24, 2012

Researchers from the NIST Center for Nanoscale Science and Technology have developed on-chip optomechanical sensors for atomic force microscopy (AFM) that

New Method Measures Movements of Tiny Devices-At Every Step

October 16, 2012

Makers of minuscule moving machines—the kind being eyed for nanomanufacturing and assembly as well as other uses—do you know where your micro- and nanorobots

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down

October 16, 2012

If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of researchers at the

False-color SEMs of cross-sectioned hematite films.

Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst

October 3, 2012

Hydrogen gas that is created using solar energy to split water into hydrogen and oxygen has the potential to be a cost-effective fuel source if the efficiency

False-color scanning electron micrograph of a nanophotonic motion sensor.

A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices

September 19, 2012

Using a microscopic optical sensor that can be batch-fabricated on a silicon chip at low cost, Researchers from the NIST Center for Nanoscale Science and

Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices

September 12, 2012

A team of researchers from the NIST Center for Nanoscale Science and Technology, the Royal Institute of Technology, Stockholm, and the University of Maryland

NIST 'Hybrid Metrology' Method Could Improve Computer Chips

September 5, 2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers

SEM image of the waveguide cross-section of the low-noise frequency converter

CNST Researchers Demonstrate Low-Noise, Chip-Based Optical Wavelength Converter

September 5, 2012

Researchers from the NIST Center for Nanoscale Science and Technology have demonstrated a low-noise device for changing the wavelength of light using

Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser

August 29, 2012

NIST Center for Nanoscale Science and Technology researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) have determined the optimum

A microfluidic lab on a chip device sitting on a polystyrene dish.

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization

August 8, 2012

Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few microliters (millionth of a

CNST Releases the Summer 2012 Edition of The CNST News

August 8, 2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This quarterly

Researchers Track Nanoparticle Dynamics in Three Dimensions

August 1, 2012

Researchers from the NIST Center for Nanoscale Science and Technology have used three-dimensional single-particle tracking to measure the dynamic behavior of

Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator

July 11, 2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally demonstrated surface

Hark! Group Demonstrates First Heralded Single Photon Source Made from Silicon

June 27, 2012

In an important step towards more practical quantum information processing, researchers from the National Institute of Standards and Technology (NIST), the

illustration of pseudomagnetic fields that confine grahene's electrons and create quntized quantum dot-like energy levels

'Tuning' Graphene Drums Might Turn Conductors to Semiconductors

June 27, 2012

Tightening or relaxing the tension on a drumhead will change the way the drum sounds. The same goes for drumheads made from graphene, only instead of changing

Shaffique Adam Receives Singapore National Research Foundation Fellowship

June 27, 2012

Shaffique Adam, an NRC Postdoctoral Research Associate in the NIST Center for Nanoscale Science and Technology, has been awarded a 2012 Singapore National

Artist's conception of JILA's advance in atomic force microscope (AFM) design.

Not-So-Precious: Stripping Gold From AFM Probes Allows Better Measurement of Picoscale Forces

June 27, 2012

Gold is not necessarily precious—at least not as a coating on atomic force microscope (AFM) probes. JILA researchers found that removing an AFM probe's gold

Graphene Drumheads Tuned to Make Quantum Dots

June 21, 2012

Tightening or relaxing the tension on a drumhead will change the way the drum sounds. The same goes for drumheads made from graphene, only instead of changing

CNST Releases the Spring 2012 Edition of The CNST News

May 25, 2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the spring 2012 edition of The CNST News. This quarterly

Spin Polarized Supercurrents Optimized with a Simple Flip

May 11, 2012

Researchers from Michigan State University, the NIST Center for Neutron Research, and the NIST Center for Nanoscale Science and Technology have discovered the

Fabrication Method Can Affect the Use of Block Copolymer Thin Films

May 2, 2012

A new study by a team including scientists from the National Institute of Standards and Technology (NIST) indicates that thin polymer films can have different

NIST researchers' new approach to trapping nanoparticles uses a control and feedback system that nudges them only when needed.

Light Touch Keeps a Grip on Delicate Nanoparticles

May 2, 2012

Using a refined technique for trapping and manipulating nanoparticles, researchers at the National Institute of Standards and Technology (NIST) have extended

X-Ray Probe Finds New Organic Transistors Do Well in Hot Water

April 17, 2012

Materials scientists from the National Institute of Standards and Technology (NIST), working with an international research team, have helped prove the

Graphic of 5 radish plants showing effects of increasing exposure to BPs and NPs

NIST/UMass Study Finds Evidence Nanoparticles May Increase Plant DNA Damage

April 17, 2012

Researchers at the National Institute of Standards and Technology (NIST) and the University of Massachusetts Amherst (UMass) have provided the first evidence

In-Situ Observations Reveal How Nanoparticle Catalysts Lower Operating Temperatures in Fuel Cells

April 10, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used environmental transmission electron microscopy

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