Dr. Kabos and Dr. Wallis are recognized for their book “Measurement Techniques for Radio Frequency Nanoelectronics.” This book represents the first comprehensive text on this subject, which continues to grow in importance as electronic devices continue to shrink to smaller dimensions. Topics covered include core concepts, calibration, instrumentation, challenges of doing measurements on nanostructures, and applications in semiconductor devices, materials and the life sciences. Reviews of the book cite its accessibility and inclusion of practical examples, sure to be of great interest to senior undergraduates and graduate students entering the field as well as to senior researchers.