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2021 Bronze Medal Award

AWARD CITATION

Dr. Stan is recognized for his development of a novel atomic force microscopy technique capable of measuring a material’s surface mechanical properties at the nanoscale. The technique he invented enables the study of delicate nanoelectronic structures that would be damaged by existing measurement methods. This new measurement capability has been recognized and accepted in the semiconductor industry and has influenced commercial microscope manufacturers.

INDIVIDUAL AWARD

Gheorghe Stan

Physicist
Material Measurement Laboratory
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