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Journal of Research (NIST JRES)

Standard Reference Materials (SRMs) for the Calibration and Validation of Analytical Methods For PCBs (as Aroclor Mixtures)

November 1, 2004

Author(s)

Michele M. Schantz, Dianne L. Poster, Stefan D. Leigh, Stephen A. Wise

Determining the Uncertainty of X-Ray Absorption Measurements

November 1, 2004

Author(s)

G S. Wojcik

X-ray absorption techniques have become more common and more accepted in the study of moisture contents and transport in building materials like cement pastes

Development of a High Throughput Method Incorporating Multiple Traditional Analytical Devices

November 1, 2004

Author(s)

Christopher C. White, E Embree, Walter E. Byrd, A R. Patel

A high-throughput system and companion informatics system has been developed and implemented using multiple traditional analytical techniques. This system

Properties of Nanostructured Hydroxyapatite Prepared by a Spray Drying Technique

November 1, 2004

Author(s)

Laurence C. Chow, Limin Sun, B Hockey

Analytical Representations of Elastic Moduli Data With Simultaneous Dependence on Temperature and Porosity

November 1, 2004

Author(s)

R G. Munro

An analytical model providing simultaneous, self-consistent representations of the temperature and porosity dependence of the elastic and bulk moduli of

Preparation and Comprehensive Characterization of a Calicum Hydroxyapatite Reference Material

November 1, 2004

Author(s)

D W. Fowler, Milenko Markovic, Michael Tung

Numerous biological and chemical studies involve the use of calcium hydroxyapatite Ca 10(PO 4) 6(OH) 2, HA. In this study detailed physicochemical

Uncertainty and Traceability for the CEESI Iowa Natural Gas Facility

September 1, 2004

Author(s)

Aaron N. Johnson, Tom Kegel

This paper presents an uncertainty analysis for the CEESI Iowa natural gas calibration facility. This facility calibrates flow meters up to flows of 10.7 actual

Stability Comparison of Recordable Optical Discs - A Study of Error Rates in Harsh Conditions

September 1, 2004

Author(s)

Oliver T. Slattery, R Lu, Jian Zheng, Frederick R. Byers, Xiao Tang

The reliability and longevity of any storage medium is a key issue for archivists and preservationists as well as for the creators of important information

High-Resolution Observations of the Infrared Spectrum of Neutral Neon

September 1, 2004

Author(s)

Craig J. Sansonetti, M M. Blackwell, Edward B. Saloman

We have observed the spectrum of neutral neon (Ne I) emitted by a microwave-excited electrodeless discharge lamp with the National Institute of Standards and

Optical Diffraction in Close Proximity to Plane Apertures. III. Modified, Self-Consistent Theory

September 1, 2004

Author(s)

Klaus Mielenz

The classical theory of diffraction by plane apertures illuminated by normally incident light is modified so that the diffraction on the source side of the

Uncertainty Propagation for NIST Visible Spectral Standards

September 1, 2004

Author(s)

J L. Gardner

Uncertainties in the NIST spectral standards for detectors and sources in the visible wavelength range are propagated from the high-accuracy cryogenic

Electron-Impact Cross Sections for Ground State to np Excitations of Sodium and Potassium

September 1, 2004

Author(s)

Philip M. Stone, Yong Sik Kim

Erratum: Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence

August 1, 2004

Author(s)

Raghu N. Kacker, Raju V. Datla, Albert C. Parr

The Remarkable Metrological History of Radiocarbon Dating [II]

August 1, 2004

Author(s)

Lloyd A. Currie

Radiocarbon dating would not have been possible if 14C had not had the wrong half-life -- a fact that delayed its discovery [1]. Following the discovery of this

Developing Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements

August 1, 2004

Author(s)

Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot

In this paper, we introduce nonlinear large-signal scattering parameters, a new type of frequency-domain mapping that related incident and reflected signals. A

Certification of NIST Standard Reference Material 1575a Pine Needles and Results of an International Laboratory Comparison

June 1, 2004

Author(s)

Elizabeth A. Mackey, Donald A. Becker, Rabia D. Oflaz, Robert R. Greenberg, Richard M. Lindstrom, Lee L. Yu, Laura J. Wood, Stephen E. Long, William R. Kelly, Jacqueline L. Mann, Bruce S. MacDonald, Stephen A. Wilson, Zoe A. Brown, Paul H. Briggs, James Budhan, Rick L. Paul

Embedded MicroHeating Elements in Polymeric MicroChannels for Temperature Control and Fluid Sensing

May 1, 2004

Author(s)

Michael Gaitan, Laurie E. Locascio

Simulation of Sheared Suspensions With a Parallel Implementation of Quaternion-Based Dissipative Particle Dynamics (QDPD)

April 1, 2004

Author(s)

James S. Sims, Nicos Martys

A quaternion-based dissipative particle dynamics (QDPD) program was developed to study the flow properties of complex fluids like suspensions, subject to shear

Standard Reference Materials (SRMs) for the Calibration and Validation of Analytical Methods for PCBs (As Aroclor Mixtures)

March 1, 2004

Author(s)

Dianne L. Poster, Michele M. Schantz, Stefan D. Leigh, Stephen A. Wise

Characterization of Combinatorial Polymer Blend Composition Gradients by FTIR Microspectroscopy

March 1, 2004

Author(s)

Naomi Eidelman, Carl G. Simon Jr.

A new FTIR technique was developed for characterizing thin polymer films used in combinatorial materials science. Fourier transform infrared microspectroscopy

Intramural comparison of NIST laser and optical fiber power calibrations

March 1, 2004

Author(s)

John H. Lehman, Igor Vayshenker, David J. Livigni, Joshua A. Hadler

The responsivity of two optical detectors was determined by the method of direct substitution in four different NIST measurement facilities. The measurements

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles

February 1, 2004

Author(s)

N G. Armstrong, W Kalceff, James Cline, John E. Bonevich

A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown

High Resolution Observations of the Infrared Spectrum of Neutral Neon

January 1, 2004

Author(s)

Craig J. Sansonetti, M M. Blackwell, Edward B. Saloman

Accuracy in Powder Diffraction III--Part 1 Preface

January 1, 2004

Author(s)

James P. Cline, B H. Toby, Jeffrey E. Post, P Scardi

Nonlinearity measurement of high power laser detectors at NIST

January 1, 2004

Author(s)

Xiaoyu X. Li, Thomas Scott, Shao Yang, Christopher L. Cromer, Marla L. Dowell

We briefly explain the fundamentals of detector nonlinearity applicable to both electrical and optical nonlinearity measurements. We specifically discuss the

Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence

November 1, 2003

Author(s)

Raghu N. Kacker, Raju V. Datla, Albert C. Parr

This paper responds to comments received by the authors on the paper, Combined Result and Associated Uncertainty from Interlaboratory Evaluations Based on the

Simulation of an Austenite-Twinned-Martensite Interface

November 1, 2003

Author(s)

Anthony J. Kearsley, L A. Melara

Developing numerical methods for predicting microstructure in materials is an extremely large and important research area. Two examples of material

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

November 1, 2003

Author(s)

R Gupta, Simon G. Kaplan

We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the

The Normalized Reduced Form and Cell Mathematical Tools for Lattice Analysis--Symmetry and Similarity

November 1, 2003

Author(s)

Alan D. Mighell

To intelligently and effectively use the crystallographic databases, dierse mathematical and computer tools are required that can delve into the nature of a

Optical-Fiber Power Meter Comparison between NIST and PTB

October 1, 2003

Author(s)

Igor Vayshenker, Holger Haars, Xiaoyu X. Li, John H. Lehman, David J. Livigni

We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Physikalisch-Technische