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Journal of Research (NIST JRES)

Noise-Optimized Silicon Radiometers

March 1, 2000

Author(s)

George P. Eppeldauer

Transimpedance-gain, loop-gain, and voltage-gain requirements of photodide short-circuit-current meters are summarized for ac and dc optical radiation

Radiative Calibration of Heat Flux Sensors at NIST: Facilities and Techniques

March 1, 2000

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

An overview of the National Institute of Standards and Technology (NIST) high temperature blackbodies, both in operation and in development, suitable for heat

Electron-Impact Total Ionization Cross Sections of Molecular Ions

March 1, 2000

Author(s)

Yong Sik Kim, Karl Irikura, M A. Ali

The Binary-Encounter-Bethe (BEB) model for electron-impact total ionization cross sections of neutral molecules has been modified for molecular ions. The total

Absolute Steady-State Thermal Conductivity Measurements by Use of a Transient Hot-Wire System

March 1, 2000

Author(s)

H M. Roder, Richard A. Perkins, Arno D. Laesecke, Carlos A. Nieto de Castro

A transient hot-wire apparatus was used to measure the thermal conductivity of argon with both steady-state and transient methods. The effects of wire diameter

In situ Metrology During the Growth of Compound Semiconductors by Molecular Beam Epitaxy

February 9, 2000

Author(s)

Donald A. Gajewski, Jonathan E. Guyer, Nhan Van Nguyen, Joseph G. Pellegrino

In this poster, we present the optical response of thin film compound semiconductors measured using in situ spectroscopic ellipsometry (SE), at growth

Formulation of Multiple Diffraction by Trees and Buildings for Radio Propagation Predictions for Local Multipoint Distribution Service

February 1, 2000

Author(s)

Wenzhe N. Zhang

This paper presents a closed-form expression for multiple forward diffraction by rows of tree canopies and buildings, applicable to the propagation predictions

Precision Measurements of Fundamental Constants Using GAMS4

January 1, 2000

Author(s)

Maynard S. Dewey, E. Kessler

High Resolution Gamma-Ray Spectroscopy: The First 85 Years, ed. by A. Aprahamian and R. Deslattes

January 1, 2000

Author(s)

R Deslattes

Electron-Impact Total Ionization Cross Secitons of Molecular Ions

January 1, 2000

Author(s)

Y -. Kim, K K. Irikura, M A. Ali

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy,

January 1, 2000

Author(s)

A R. Kalukin, B Winn, S S. Wang, C Jacobsen, Zachary H. Levine, Jing Fu

High Resolution γ-Ray Spectroscopy: the First 85 Years

January 1, 2000

Author(s)

R Deslattes

This opening review attempts to follow the main trends in crystal diffraction spectrometry of nuclear γ-rays from its 1914 beginning in Rutherford's laboratory

The NIST Quantitative Infrared Database

December 1, 1999

Author(s)

Pamela M. Chu, Franklin R. Guenther, George C. Rhoderick, W J. Lafferty

Thermodynamic Temperatures of the Triple Points of Mercury and Gallium and in the Interval 217 to 303 K

December 1, 1999

Author(s)

Michael R. Moldover, S J. Boyes, Christopher W. Meyer, A R. Goodwin

Performance Verification of Impact Machines for Testing Plastics

December 1, 1999

Author(s)

Thomas A. Siewert, D P. Vigliotti, L B. Dirling, Christopher N. McCowan

Valid comparison of impact test energies reported by various organizations and over time depends on consistent performance of impact test machines. This paper

Validation of the Conversion to New Instrumentation and the Modernization of Isotope Dilution Mass Spectrometric Definitive Methods for Organic Serum Analytes

December 1, 1999

Author(s)

P M. Ellerbe, C Phinney, Lorna T. Sniegoski, Michael J. Welch

Status Report on the First Round of the Development of the Advanced Encryption Standard

November 17, 1999

Author(s)

James R. Nechvatal, Elaine B. Barker, Donna F. Dodson, Morris J. Dworkin, James Foti, E Roback

In 1997, the National Institute of Standards and Technology (NIST) initiated a process to select a symmetric-key encryption algorithm to be used to protect

On the Diffraction Limit for Lensless Imaging

November 17, 1999

Author(s)

Klaus Mielenz

The diffraction limit for lensless imaging, defined as the smallest obtainable point image, is analyzed and compared to the corresponding limit for imaging with

Comparative Calibration of Heat Flux Sensors in Two Blackbody Facilities

November 17, 1999

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

This paper presents the results of heat flux sensor calibrations in two blackbody facilities: the 25 mm variable temperature blackbody (VTBB) primary facility

Dynamic Power-Conscious Routing for MANETs: An Initial Approach

November 1, 1999

Author(s)

M W. Subbarao

We develop an initial dynamic power-conscious routing scheme (MPR) that incorporates physical layer and link layer statistics to conserve power, while

Applicability of Metrology to Information Technology

November 1, 1999

Author(s)

M M. Gray

In 1959, the Director of the National Bureau of Standards declared The emergence of science and technology as the paramount concern of the Nation in the 20th

Equivalent Electrical Circuit Representations of AC Quantized Hall Resistance Standards

November 1, 1999

Author(s)

Marvin E. Cage, Anne-Marie Jeffery, J. Matthews

We use equivalent electrical circuits to analyze the effects of large parasitic impedances existing in all sample probes on four-terminal-pair measurements of

Measurement of the Rheological Properties of High Performance Concrete: State of the Art Report

October 1, 1999

Author(s)

Chiara F. Ferraris

The rheological or flow properties of concrete in general and of high performance concrete (HPC) in particular, are important because many factors such as ease

A Conceptual Data Model of Datum Systems

September 23, 1999

Author(s)

Michael R. McCaleb

A new conceptual data model that addresses the geometric dimensioning and tolerancing concepts of datum systems, datums, datum features, datum targets, and the

Second Advanced Encryption Standard Candidate Conference

September 23, 1999

Author(s)

Morris J. Dworkin

On March 22-23, 1999, nearly two hundred members of the global cryptographic research community gathered in Rome, Italy, for the Second Advanced Encryption

NIST Reference Densitometer for Visual Diffuse Transmission Density

July 26, 1999

Author(s)

E A. Early, Christopher L. Cromer, X Xiong, D J. Dummer, Thomas R. O'Brian, Albert C. Parr

The Optical Technology Division of the National Institute of Standards and Technology has developed a new reference densitometer for measuring visual diffuse

Primary Phase Field of the Pb-Doped 2223 High Tc Superconductor in the (Bi,Pb)-Sr-Ca-Cu-O System

July 23, 1999

Author(s)

Winnie K. Wong-Ng, Lawrence P. Cook, Anthony J. Kearsley, W Greenwood

Both liquidus and subsolidus phase equilibrium data are of central importance for applications of high temperature superconductors in the (Bi,Pb)-Sr-Ca-Cu-O

The NIST Length Scale Interferometer

July 23, 1999

Author(s)

John S. Beers, William B. Penzes

The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in

Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements

July 1, 1999

Author(s)

Marvin E. Cage, Anne-Marie Jeffery

We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R H. The object of

A Complete Multimode Equivalent-Circuit Theory for Electrical Design

June 22, 1999

Author(s)

Dylan F. Williams, L. A. Hayden, Roger Marks

This work presents a complete equivalent-circuit theory for lossy multimode transmission lines. Its voltages and currents are based on general linear

Vacuum Processing Technique for Development of Primary Standard Blackbodies

June 1, 1999

Author(s)

Magdalena Navarro, Sally Bruce, B. Carol Johnson, A V. Murthy, Robert D. Saunders

Blackbody sources with nearly unity emittance that are in equilibrium with a pure freezing metal such as gold, silver, or copper are used as primary standard