The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
For additional information see: About the Journal
Volume 112 | ISSN: 1044-677X |
Issue 1 | Issue 2 |
Issue 3 | Issue 4 |
Issue 5 | Issue 6 |
20 °C—A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements , p. 1
Ted Doiron
http://dx.doi.org/10.6028/jres.112.001
Will Future Measurement Needs of the Semiconductor Industry Be Met? , p. 25
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.112.002
"Once is Enough" in Radiometric Calibrations , p. 39
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, and Albert C. Parr
http://dx.doi.org/10.6028/jres.112.003
"A Doubt is at Best an Unsafe Standard": Measuring Sugar in the Early Bureau of Standards , p. 53
David Singerman
http://dx.doi.org/10.6028/jres.112.004
Complex Permittivity of Planar Building Materials Measured With an Ultra-Wideband Free-Field Antenna Measurement System , p. 67
Ben Davis, Chriss Grosvenor, Robert Johnk, David Novotny, James Baker-Jarvis, and Michael Janezic
http://dx.doi.org/10.6028/jres.112.005
4He Thermophysical Properties: New Ab Initio Calculations , p. 75
John J. Hurly and James B. Mehl
http://dx.doi.org/10.6028/jres.112.006
Cosmic Coincidences: Investigations for Neutron Background Suppression , p. 95
Craig R. Heimbach
http://dx.doi.org/10.6028/jres.112.007
Effect of Power Line Interference on Microphone Calibration Measurements Made at or Near Harmonics of the Power Line Frequency , p. 107
Randall P. Wagner and Victor Nedzelnitsky
http://dx.doi.org/10.6028/jres.112.008
Low Cost Digital Vibration Meter , p. 115
W. Vance Payne and Jon Geist
http://dx.doi.org/10.6028/jres.112.009
Comparison of Calibration Methods for Tristimulus Colorimeters , p. 129
James L. Gardner
http://dx.doi.org/10.6028/jres.112.010
Biophotonic Tools in Cell and Tissue Diagnostics , p. 139
Michael Brownstein, Robert A. Hoffman, Richard Levenson, Thomas E. Milner, M. L. Dowell, P. A. Williams, G. S. White, A. K. Gaigalas, and J. C. Hwang
http://dx.doi.org/10.6028/jres.112.011
Flow Control Through the Use of Topography , p. 153
D. L. Cotrell and A. J. Kearsley
http://dx.doi.org/10.6028/jres.112.012
Acoustic Eigenvalues of a Quasispherical Resonator: Second Order Shape Perturbation Theory for Arbitrary Modes , p. 163
James B. Mehl
http://dx.doi.org/10.6028/jres.112.013
Erratum: See correct description of Cover art for Volume 112, Number 2, March-April 2007 , p. 175
http://dx.doi.org/10.6028/jres.112.014
Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission Lines , p. 177
Jon Geist, Jayna J. Shah, Mulpuri V. Rao, and Michael Gaitan
http://dx.doi.org/10.6028/jres.112.015
Modeling of Photochemical Reactions in a Focused Laser Beam , p. 191
A. K. Gaigalas, F. Y. Hunt, and L. Wang
http://dx.doi.org/10.6028/jres.112.016
Extracting Electron Densities in N-Type GaAs From Raman Spectra: Theory , p. 209
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.112.017
Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer Thicknesses , p. 223
Janet C. Marshall and P. Thomas Vernier
http://dx.doi.org/10.6028/jres.112.018
Measurement Tools for the Immersive Visualization Environment: Steps Toward the Virtual Laboratory , p. 257
John G. Hagedorn, Joy P. Dunkers, Steven G. Satterfield, Adele P. Peskin, John T. Kelso, and Judith E. Terrill
http://dx.doi.org/10.6028/jres.112.019
Convective Instabilities in Two Liquid Layers , p. 271
G. B. McFadden, S. R. Coriell, K. F. Gurski, and D. L. Cotrell
http://dx.doi.org/10.6028/jres.112.020
Comparison Between NIST and AF Laser Energy Standards Using High Power Lasers , p. 283
Xiaoyu Li, Thomas Scott, Chris Cromer, David Cooper, and Steven Comisford
http://dx.doi.org/10.6028/jres.112.021
Optical Frequency Metrology of an Iodine-Stabilized He-Ne Laser Using the Frequency Comb of a Quantum-Interference-Stabilized Mode-Locked Laser , p. 289
Ryan P. Smith, Peter A. Roos, Jared K. Wahlstrand, Jessica A. Pipis, Maria Belmonte Rivas, and Steven T. Cundiff
http://dx.doi.org/10.6028/jres.112.022
Comment on "Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm" , p. 297
Craig J. Sansonetti
http://dx.doi.org/10.6028/jres.112.023
Holmium Oxide Glass Wavelength Standards , p. 303
David W. Allen
http://dx.doi.org/10.6028/jres.112.024
A Quantum Algorithm Detecting Concentrated Maps , p. 307
Isabel Beichl, Stephen S. Bullock, and Daegene Song
http://dx.doi.org/10.6028/jres.112.025
Subject Index to Volume 112 , p. 313
Author Index to Volume 112 , p. 317