The Journal of Research of NIST and its predecessors report NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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Volume 69C | ISSN: 0022-4316 |
Issue 1 | Issue 2 |
Issue 3 | Issue 4 |
Corrections, p. ii
http://dx.doi.org/10.6028/jres.069C.001
Two picnometers of increased convenience and precision, p. 1
Johnson, Arnold
http://dx.doi.org/10.6028/jres.069C.002
Construction of a Michelson interferometer for Fourier spectroscopy, p. 5
Rundle, Howard N.
http://dx.doi.org/10.6028/jres.069C.003
The National Bureau of Standards gas thermometer. II. Measurement of capacitance to a grounded surface with a transformer ratio-arm bridge, p. 13
Guildner, L.A.; Edsinger, R.E.
http://dx.doi.org/10.6028/jres.069C.004
An adiabatic calorimeter for the range 10 to 360 °K, p. 19
Sterrett, K.F.; Blackburn, D.H.; Bestul, A.B.; Chang, S.S.; Horman, J.
http://dx.doi.org/10.6028/jres.069C.005
A rugged null-type pressure transducer of high reproducibility for accurate gas phase PVT measurements, p. 27
Waxman, Meyer; Chen, William T.
http://dx.doi.org/10.6028/jres.069C.006
Detection and damping of thermal-acoustic oscillations in low-temperature measurements, p. 35
Ditmars, David A.; Furukawa, George T.
http://dx.doi.org/10.6028/jres.069C.007
NBS free-air chamber for measurement of 10 to 60 kV x rays, p. 39
Lamperti, P.J.; Wyckoff, H.O.
http://dx.doi.org/10.6028/jres.069C.008
A compensated solenoid giving a uniform magnetic field over a large volume, p. 49
Snow, Chester; Driscoll, Raymond L.
http://dx.doi.org/10.6028/jres.069C.009
Evaluation of a microwave phase measurement system, p. 55
Ellerbruch, Doyle A.
http://dx.doi.org/10.6028/jres.069C.010
Polarographic analysis of titanium (IV)-EDTA complex: Application to paint pigments, p. 67
Berger, Harvey W.; Cadoff, Barry C.
http://dx.doi.org/10.6028/jres.069C.011
Soil resistivity as related to underground corrosion and cathodic protection, p. 71
Schwerdtfeger, W.J.
http://dx.doi.org/10.6028/jres.069C.012
Temperatures of thermocouple reference junctions in an ice bath, p. 95
Caldwell, Frank R.
http://dx.doi.org/10.6028/jres.069C.013
Superimposed birefractory plates, p. 103
Adams, L.H.; Waxler, R.M.
http://dx.doi.org/10.6028/jres.069C.014
A self-calibrating instrument for measuring conductance at radio frequencies, p. 115
Huntley, Leslie E.
http://dx.doi.org/10.6028/jres.069C.015
Exact inductance equations for rectangular conductors with applications to more complicated geometries, p. 127
Hoer, Cletus; Love, Carl
http://dx.doi.org/10.6028/jres.069C.016
Common volume of two intersecting cylinders, p. 139
Hubbell, J.H.
http://dx.doi.org/10.6028/jres.069C.017
Steady-state heat conduction in an exposed exterior column of rectangular cross section, p. 145
Peavy, B.A.
http://dx.doi.org/10.6028/jres.069C.018
Two-terminal dielectric measurements up to 6 x 108 Hz, p. 165
Broadhurst, Martin G.; Bur, Anthony J.
http://dx.doi.org/10.6028/jres.069C.019
Improved ten-picofarad fused silica dielectric capacitor, p. 173
Cutkosky, R.D.; Lee, L.H.
http://dx.doi.org/10.6028/jres.069C.020
Errors in the series-parallel buildup of four-terminal resistors, p. 181
Page, Chester H.
http://dx.doi.org/10.6028/jres.069C.021
Centerable rotator for measuring properties of crystals, p. 191
Saylor, Charles P.; Lowey, Herbert B.
http://dx.doi.org/10.6028/jres.069C.022
Equipment for single-crystal growth from the melt suitable for substances with a low melting point, p. 195
Horton, Avery T.; Glasgow, Augustus R.
http://dx.doi.org/10.6028/jres.069C.023
Phase and amplitude contrast microscopy in partially coherent light, p. 199
De, M.; Mondal, P.K.
http://dx.doi.org/10.6028/jres.069C.024
Exposure time relations for Kossel microdiffraction photographs, p. 213
Yakowitz, H.; Vieth, D.L.
http://dx.doi.org/10.6028/jres.069C.025
Cartesian diver as a density comparator, p. 217
Bowman, Horace A.; Schoonover, Randall M.
http://dx.doi.org/10.6028/jres.069C.026
Cryogenic behavior of selected magnetic materials, p. 225
Gniewek, J.J.; Ploge, E.
http://dx.doi.org/10.6028/jres.069C.027
Some applications of the wave front shearing interferometer, p. 245
Saunders, James B.
http://dx.doi.org/10.6028/jres.069C.028
Precision method for evaluating primary aberrations of lenses with a Twyman interferometer, p. 251
Saunders, James B.
http://dx.doi.org/10.6028/jres.069C.029
Comparators for voltage transformer calibrations at NBS, p. 257
Sze, Wilbur C.
http://dx.doi.org/10.6028/jres.069C.030
Voltage dependence of precision air capacitors, p. 265
Shields, J.Q.
http://dx.doi.org/10.6028/jres.069C.031
Single-crystal x-ray diffraction at high pressures, p. 275
Weir, C.; Block, S.; Piermarini, G.
http://dx.doi.org/10.6028/jres.069C.032
The Sondheimer-Wilson-Kohler formula in platinum resistance thermometry, p. 283
Corruccini, R.J.
http://dx.doi.org/10.6028/jres.069C.033
Stress analysis of tape-wound magnet coils, p. 287
Hord, Jesse
http://dx.doi.org/10.6028/jres.069C.034
Centerline correction for precision roughness specimens, p. 303
Chamberlin, J.L.
http://dx.doi.org/10.6028/jres.069C.035
Electric currents and potentials resulting from the flow of charged liquid hydrocarbons through short pipes, p. 307
Shafer, M.R.; Baker, D.W.; Benson, K.R.
http://dx.doi.org/10.6028/jres.069C.036
A transistor screening procedure using leakage current measurements, p. 319
Conrad, George T.; Shook, Donald C.
http://dx.doi.org/10.6028/jres.069C.037