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TOOLS & INSTRUMENTS

Sample Preparation and Metrology Tools

Fischione 1040 Nanomill
Fischione 1040 Nanomill for post-FIB clean up of TEM lamellae.
Leica DM8000
Leica DM8000 optical microscope for inspection. Features polarization optics, including DIC, and long working distance objectives (~1cm) up to 100x.
Gatan Precision Ion Polishing System
Gatan Precision Ion Polishing System for TEM preparation.
 Image of optical detector on coin taken with stackshot camera
 Image of optical detector on coin taken with stackshot camera
Credit: Nathan Tomlin
optical profilometer
Zeta optical profilometer for large scale imaging and thickness profiling.
microscope
Bruker Dimension Icon/Fastscan Atomic Force Microscope for surface characterization

 

Nanofabrication / manufacturing, Nanometrology, Nanophotonics and Physics
Created June 8, 2016, Updated May 4, 2021